Vijay Raghavan, M. Shakeri, Krishna R. Pattipati. Test sequencing problems arising in test planning and design for testability. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 29(2):153-163, 1999.
@article{RaghavanSP99a,
title = {Test sequencing problems arising in test planning and design for testability},
author = {Vijay Raghavan and M. Shakeri and Krishna R. Pattipati},
year = {1999},
tags = {testing, design},
researchr = {https://researchr.org/publication/RaghavanSP99a},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Systems, Man, and Cybernetics, Part A},
volume = {29},
number = {2},
pages = {153-163},
}