Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters

Ashwin Raghunathan, Ji Hwan (Paul) Chun, Jacob A. Abraham, Abhijit Chatterjee. Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 252-261, IEEE, 2004. [doi]

Authors

Ashwin Raghunathan

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Ji Hwan (Paul) Chun

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Jacob A. Abraham

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Abhijit Chatterjee

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