Tamjid Al Rahat, Yanju Chen, Yu Feng 0001, Yuan Tian 0001. Automated Repair of OpenID Connect Programs. In 40th IEEE/ACM International Conference on Automated Software Engineering, ASE 2025, Seoul, Korea, Republic of, November 16-20, 2025. pages 2261-2273, IEEE, 2025. [doi]
Abstract is missing.