Abbas Rahimi, Luca Benini, Rajesh K. Gupta. Analysis of instruction-level vulnerability to dynamic voltage and temperature variations. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 1102-1105, IEEE, 2012. [doi]
@inproceedings{RahimiBG12,
title = {Analysis of instruction-level vulnerability to dynamic voltage and temperature variations},
author = {Abbas Rahimi and Luca Benini and Rajesh K. Gupta},
year = {2012},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6176659},
researchr = {https://researchr.org/publication/RahimiBG12},
cites = {0},
citedby = {0},
pages = {1102-1105},
booktitle = {2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012},
editor = {Wolfgang Rosenstiel and Lothar Thiele},
publisher = {IEEE},
isbn = {978-1-4577-2145-8},
}