Abbas Rahimi, Luca Benini, Rajesh K. Gupta. Analysis of instruction-level vulnerability to dynamic voltage and temperature variations. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 1102-1105, IEEE, 2012. [doi]
Abstract is missing.