Munaf Rahimo, Frank Richter, Fabian Fischer, Umamaheswara Vemulapati, Arnost Kopta, Chiara Corvasce, Silvan Geissmann, Marco Bellini, Martin J. Bayer, Friedhelm Bauer. The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. Microelectronics Reliability, 58:51-57, 2016. [doi]
Abstract is missing.