Habib Ur Rahman, Matchima Buddhanoy, Mondal Anik Kumar, Sudeep Pasricha, Biswajit Ray. Rowhammer Vulnerabilities in 3D NAND Flash Induced by Hot Carrier Injection. In IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2026, Washington, DC, USA, May 4-7, 2026. pages 23-33, IEEE, 2026. [doi]
Abstract is missing.