Assessing Changes in Dielectric Properties Due to Nanomaterials Using a Two-Port Microwave System

Mohammed Rahman, Rachita Lahri, Syed Ahsan 0001, Maya Thanou, Panagiotis Kosmas. Assessing Changes in Dielectric Properties Due to Nanomaterials Using a Two-Port Microwave System. Sensors, 20(21):6228, 2020. [doi]

Abstract

Abstract is missing.