Noise Analysis to Guide Denoising of Scanning Electron Microscopy Images - researchr publication authors

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Sheikh Shah Mohammad Motiur Rahman, Michel Salomon, Sounkalo Dembélé. Noise Analysis to Guide Denoising of Scanning Electron Microscopy Images. In 9th International Conference on Control, Decision and Information Technologies, CoDIT 2023, Rome, Italy, July 3-6, 2023. pages 1559-1564, IEEE, 2023. [doi]

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