Sheikh Shah Mohammad Motiur Rahman, Michel Salomon, Sounkalo Dembélé. Noise Analysis to Guide Denoising of Scanning Electron Microscopy Images. In 9th International Conference on Control, Decision and Information Technologies, CoDIT 2023, Rome, Italy, July 3-6, 2023. pages 1559-1564, IEEE, 2023. [doi]
@inproceedings{RahmanSD23,
title = {Noise Analysis to Guide Denoising of Scanning Electron Microscopy Images},
author = {Sheikh Shah Mohammad Motiur Rahman and Michel Salomon and Sounkalo Dembélé},
year = {2023},
doi = {10.1109/CoDIT58514.2023.10284219},
url = {https://doi.org/10.1109/CoDIT58514.2023.10284219},
researchr = {https://researchr.org/publication/RahmanSD23},
cites = {0},
citedby = {0},
pages = {1559-1564},
booktitle = {9th International Conference on Control, Decision and Information Technologies, CoDIT 2023, Rome, Italy, July 3-6, 2023},
publisher = {IEEE},
isbn = {979-8-3503-1140-2},
}