Deep Learning Based Workflow for Accelerated Industrial X-Ray Computed Tomography

Obaidullah Rahman, Singanallur V. Venkatakrishnan, Luke Scime, Paul Brackman, Curtis Frederick, Ryan Dehoff, Vincent C. Paquit, Amirkoushyar Ziabari. Deep Learning Based Workflow for Accelerated Industrial X-Ray Computed Tomography. In IEEE International Conference on Image Processing, ICIP 2023, Kuala Lumpur, Malaysia, October 8-11, 2023. pages 2990-2994, IEEE, 2023. [doi]

Authors

Obaidullah Rahman

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Singanallur V. Venkatakrishnan

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Luke Scime

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Paul Brackman

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Curtis Frederick

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Ryan Dehoff

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Vincent C. Paquit

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Amirkoushyar Ziabari

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