Obaidullah Rahman, Singanallur V. Venkatakrishnan, Luke Scime, Paul Brackman, Curtis Frederick, Ryan Dehoff, Vincent C. Paquit, Amirkoushyar Ziabari. Deep Learning Based Workflow for Accelerated Industrial X-Ray Computed Tomography. In IEEE International Conference on Image Processing, ICIP 2023, Kuala Lumpur, Malaysia, October 8-11, 2023. pages 2990-2994, IEEE, 2023. [doi]
Abstract is missing.