Kamran Rahmani, Sudhi Proch, Prabhat Mishra. Efficient Selection of Trace and Scan Signals for Post-Silicon Debug. IEEE Trans. VLSI Syst., 24(1):313-323, 2016. [doi]
@article{RahmaniPM16,
title = {Efficient Selection of Trace and Scan Signals for Post-Silicon Debug},
author = {Kamran Rahmani and Sudhi Proch and Prabhat Mishra},
year = {2016},
doi = {10.1109/TVLSI.2015.2396083},
url = {http://dx.doi.org/10.1109/TVLSI.2015.2396083},
researchr = {https://researchr.org/publication/RahmaniPM16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {24},
number = {1},
pages = {313-323},
}