Low cost soft error hardened latch designs for nano-scale CMOS technology in presence of process variation

Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli. Low cost soft error hardened latch designs for nano-scale CMOS technology in presence of process variation. Microelectronics Reliability, 53(6):912-924, 2013. [doi]

Authors

Ramin Rajaei

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Mahmoud Tabandeh

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Mahdi Fazeli

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