Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli. Low cost soft error hardened latch designs for nano-scale CMOS technology in presence of process variation. Microelectronics Reliability, 53(6):912-924, 2013. [doi]
@article{RajaeiTF13,
title = {Low cost soft error hardened latch designs for nano-scale CMOS technology in presence of process variation},
author = {Ramin Rajaei and Mahmoud Tabandeh and Mahdi Fazeli},
year = {2013},
doi = {10.1016/j.microrel.2013.02.012},
url = {http://dx.doi.org/10.1016/j.microrel.2013.02.012},
researchr = {https://researchr.org/publication/RajaeiTF13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {6},
pages = {912-924},
}