The impact of using regression models to build defect classifiers - researchr publication authors

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Gopi Krishnan Rajbahadur, Shaowei Wang, Yasutaka Kamei, Ahmed E. Hassan. The impact of using regression models to build defect classifiers. In Jesús M. Gonzalez-Barahona, Abram Hindle, Lin Tan, editors, Proceedings of the 14th International Conference on Mining Software Repositories, MSR 2017, Buenos Aires, Argentina, May 20-28, 2017. pages 135-145, ACM, 2017. [doi]

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