The impact of using regression models to build defect classifiers

Gopi Krishnan Rajbahadur, Shaowei Wang, Yasutaka Kamei, Ahmed E. Hassan. The impact of using regression models to build defect classifiers. In Jesús M. Gonzalez-Barahona, Abram Hindle, Lin Tan, editors, Proceedings of the 14th International Conference on Mining Software Repositories, MSR 2017, Buenos Aires, Argentina, May 20-28, 2017. pages 135-145, ACM, 2017. [doi]

Abstract

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