Nachiket Rajderkar, Marco Ottavi, Salvatore Pontarelli, Jie Han, Fabrizio Lombardi. On the Effects of Intra-gate Resistive Open Defects in Gates at Nanoscaled CMOS. In 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011. pages 309-315, IEEE, 2011. [doi]
Abstract is missing.