Jeyavijayan Rajendran, Harika Manem, Ramesh Karri, Garrett S. Rose. An Approach to Tolerate Process Related Variations in Memristor-Based Applications. In VLSI Design 2011: 24th International Conference on VLSI Design, IIT Madras, Chennai, India, 2-7 January 2011. pages 18-23, IEEE, 2011. [doi]
@inproceedings{RajendranMKR11,
title = {An Approach to Tolerate Process Related Variations in Memristor-Based Applications},
author = {Jeyavijayan Rajendran and Harika Manem and Ramesh Karri and Garrett S. Rose},
year = {2011},
doi = {10.1109/VLSID.2011.49},
url = {http://dx.doi.org/10.1109/VLSID.2011.49},
researchr = {https://researchr.org/publication/RajendranMKR11},
cites = {0},
citedby = {0},
pages = {18-23},
booktitle = {VLSI Design 2011: 24th International Conference on VLSI Design, IIT Madras, Chennai, India, 2-7 January 2011},
publisher = {IEEE},
}