A new local homogeneity analysis method based on pixel intensities for image defect detection

B. Rajitha, Anjana Tiwari, Suneeta Agarwal. A new local homogeneity analysis method based on pixel intensities for image defect detection. In 2nd IEEE International Conference on Recent Trends in Information Systems, ReTIS 2015, Kolkata, India, July 9-11, 2015. pages 200-206, IEEE, 2015. [doi]

Abstract

Abstract is missing.