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    Embedded Deterministic Test for Low-Cost Manufacturing Test

    Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian. Embedded Deterministic Test for Low-Cost Manufacturing Test. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 301-310, IEEE Computer Society, 2002. [doi]

    Authors

    Janusz Rajski

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    Jerzy Tyszer

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    Mark Kassab

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    Nilanjan Mukherjee

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    Rob Thompson

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    Kun-Han Tsai

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    Andre Hertwig

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    Nagesh Tamarapalli

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    Grzegorz Mrugalski

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    Geir Eide

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    Jun Qian

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