Guided Fault Injection Strategy for Rapid Critical Bit Detection in Radiation-Prone SRAM-FPGA - researchr publication authors

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Trishna Rajkumar, Johnny Öberg. Guided Fault Injection Strategy for Rapid Critical Bit Detection in Radiation-Prone SRAM-FPGA. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2024, Valencia, Spain, March 25-27, 2024. pages 1-6, IEEE, 2024. [doi]

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