Janusz Rajski. Test compression - real issues and matching solutions. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 2, IEEE, 2005. [doi]
@inproceedings{Rajski05-0, title = {Test compression - real issues and matching solutions}, author = {Janusz Rajski}, year = {2005}, doi = {10.1109/TEST.2005.1584114}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584114}, researchr = {https://researchr.org/publication/Rajski05-0}, cites = {0}, citedby = {0}, pages = {2}, booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005}, publisher = {IEEE}, isbn = {0-7803-9038-5}, }