Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Thomas Rinderknecht. Embedded Test for Low Cost Manufacturing. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 21-23, IEEE Computer Society, 2004. [doi]
@inproceedings{RajskiMTR04,
title = {Embedded Test for Low Cost Manufacturing},
author = {Janusz Rajski and Nilanjan Mukherjee and Jerzy Tyszer and Thomas Rinderknecht},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/vlsid/2004/2072/00/20720021.pdf},
tags = {testing},
researchr = {https://researchr.org/publication/RajskiMTR04},
cites = {0},
citedby = {0},
pages = {21-23},
booktitle = {17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2072-3},
}