Janusz Rajski, Kan Thapar. Nanometer Design: What are the Requirements for Manufacturing Test?. In 2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France. pages 930-937, IEEE Computer Society, 2004. [doi]
@inproceedings{RajskiT04,
title = {Nanometer Design: What are the Requirements for Manufacturing Test?},
author = {Janusz Rajski and Kan Thapar},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/date/2004/2085/02/208520930abs.htm},
tags = {testing, design},
researchr = {https://researchr.org/publication/RajskiT04},
cites = {0},
citedby = {0},
pages = {930-937},
booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-2085-5},
}