Janusz Rajski, Jerzy Tyszer, Chen Wang, Sudhakar M. Reddy. Finite memory test response compactors for embedded test applications. IEEE Trans. on CAD of Integrated Circuits and Systems, 24(4):622-634, 2005. [doi]
@article{RajskiTWR05,
title = {Finite memory test response compactors for embedded test applications},
author = {Janusz Rajski and Jerzy Tyszer and Chen Wang and Sudhakar M. Reddy},
year = {2005},
doi = {10.1109/TCAD.2005.844111},
url = {http://dx.doi.org/10.1109/TCAD.2005.844111},
tags = {testing},
researchr = {https://researchr.org/publication/RajskiTWR05},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {24},
number = {4},
pages = {622-634},
}