Patricia A. S. Ralston, James H. Graham, Gail W. DePuy, Chris Arnold, Sean Uhl. Intelligent Chemometrics-Based Approach for Chemical Process Fault Monitoring and Diagnosis. In Adel Said Elmaghraby, Robert Dees, editors, Proceedings of the 11th Conference on Intelligent Systems: Emerging Technologies, July 18-20, 2002, Boston, Massachusetts, USA. pages 91-96, ISCA, 2002.
Abstract is missing.