Drain Induced Barrier Widening and Reverse Short Channel Effects in Tunneling FETs: Investigation and Analysis

Mamidala Karthik Ram, Neha Tiwari, Dawit Burusie Abdi, Sneh Saurabh. Drain Induced Barrier Widening and Reverse Short Channel Effects in Tunneling FETs: Investigation and Analysis. IEEE Access, 9:150366-150372, 2021. [doi]

Abstract

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