Measurement Patterns: User-Oriented Strategies for Dealing with Measurements and Dimensions in Making Processes

Raf Ramakers, Danny Leen, Jeeeun Kim, Kris Luyten, Steven Houben, Tom Veuskens. Measurement Patterns: User-Oriented Strategies for Dealing with Measurements and Dimensions in Making Processes. In Albrecht Schmidt 0001, Kaisa Väänänen, Tesh Goyal, Per Ola Kristensson, Anicia Peters, Stefanie Mueller 0001, Julie R. Williamson, Max L. Wilson 0001, editors, Proceedings of the 2023 CHI Conference on Human Factors in Computing Systems, CHI 2023, Hamburg, Germany, April 23-28, 2023. ACM, 2023. [doi]

Authors

Raf Ramakers

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Danny Leen

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Jeeeun Kim

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Kris Luyten

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Steven Houben

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Tom Veuskens

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