Bharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht. Process capability indices and product reliability. Microelectronics Reliability, 41(12):2067-2070, 2001. [doi]
@article{RamakrishnanSP01,
title = {Process capability indices and product reliability},
author = {Bharatwaj Ramakrishnan and Peter Sandborn and Michael G. Pecht},
year = {2001},
doi = {10.1016/S0026-2714(01)00227-X},
url = {http://dx.doi.org/10.1016/S0026-2714(01)00227-X},
tags = {reliability},
researchr = {https://researchr.org/publication/RamakrishnanSP01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {12},
pages = {2067-2070},
}