Ajay Raman, Vibhor Jain, Elanchezhian Veeramani, Beng Woon Lim, Uppili S. Raghunathan, Yves Ngu, Alvin Joseph. Analysis of the Factors Limiting the RF Breakdown Voltage in SiGe HBTs for Wi-Fi PA Applications. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2021, Monterey, CA, USA, December 5-8, 2021. pages 1-4, IEEE, 2021. [doi]
@inproceedings{RamanJVLRNJ21, title = {Analysis of the Factors Limiting the RF Breakdown Voltage in SiGe HBTs for Wi-Fi PA Applications}, author = {Ajay Raman and Vibhor Jain and Elanchezhian Veeramani and Beng Woon Lim and Uppili S. Raghunathan and Yves Ngu and Alvin Joseph}, year = {2021}, doi = {10.1109/BCICTS50416.2021.9682457}, url = {https://doi.org/10.1109/BCICTS50416.2021.9682457}, researchr = {https://researchr.org/publication/RamanJVLRNJ21}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2021, Monterey, CA, USA, December 5-8, 2021}, publisher = {IEEE}, isbn = {978-1-6654-3990-9}, }