Rajaraman Ramanarayanan, Vijay Degalahal, Krishnan Ramakrishnan, Jung Sub Kim, Vijaykrishnan Narayanan, Yuan Xie, Mary Jane Irwin, Kenan Unlu. Modeling Soft Errors at the Device and Logic Levels for Combinational Circuits. IEEE Trans. Dependable Sec. Comput., 6(3):202-216, 2009. [doi]
Abstract is missing.