Bias dependence in statistical random telegraph noise analysis based on nanoscale CMOS ring oscillators

Semih Ramazanoglu, Alicja Michalowska-Forsyth, Bernd Deutschmann. Bias dependence in statistical random telegraph noise analysis based on nanoscale CMOS ring oscillators. Elektrotechnik und Informationstechnik, 141(1):37-46, March 2024. [doi]

Abstract

Abstract is missing.