Automatic generation of memory consistency tests for chip multiprocessing

Eberle A. Rambo, Olav P. Henschel, Luiz C. V. dos Santos. Automatic generation of memory consistency tests for chip multiprocessing. In 18th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2011, Beirut, Lebanon, December 11-14, 2011. pages 542-545, IEEE, 2011. [doi]

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