S. Ramey, M. Chahal, P. Nayak, S. Novak, C. Prasad, J. Hicks. Transistor reliability variation correlation to threshold voltage. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 3, IEEE, 2015. [doi]
Abstract is missing.