Keyvan Ramezanpour, Paul Ampadu, William Diehl. Fault Intensity Map Analysis with Neural Network Key Distinguisher. In Chip-Hong Chang, Ulrich Rührmair, Daniel E. Holcomb, Patrick Schaumont, editors, Proceedings of the 3rd ACM Workshop on Attacks and Solutions in Hardware Security Workshop, ASHES@CCS 2019, London, UK, November 15, 2019. pages 33-42, ACM, 2019. [doi]
Abstract is missing.