Self-adjustment methodology of a thermal camera for detecting faults in industrial machinery

Juan A. Ramirez-Nunez, Luis Alberto Morales-Hernández, Roque Alfredo Osornio-Rios, Jose A. Antonino-Daviu, René de Jesús Romero-Troncoso. Self-adjustment methodology of a thermal camera for detecting faults in industrial machinery. In IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society, Florence, Italy, October 23-26, 2016. pages 7119-7124, IEEE, 2016. [doi]

Abstract

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