Eduardo H. Ramírez, Ramón F. Brena, Davide Magatti, Fabio Stella. Probabilistic Metrics for Soft-Clustering and Topic Model Validation. In Jimmy Xiangji Huang, Irwin King, Vijay V. Raghavan, Stefan Rueger, editors, 2010 IEEE/WIC/ACM International Conference on Web Intelligence, WI 2010, Toronto, Canada, August 31 - September 3, 2010, Main Conference Proceedings. pages 406-412, IEEE, 2010. [doi]
@inproceedings{RamirezBMS10,
title = {Probabilistic Metrics for Soft-Clustering and Topic Model Validation},
author = {Eduardo H. Ramírez and Ramón F. Brena and Davide Magatti and Fabio Stella},
year = {2010},
doi = {10.1109/WI-IAT.2010.148},
url = {http://dx.doi.org/10.1109/WI-IAT.2010.148},
researchr = {https://researchr.org/publication/RamirezBMS10},
cites = {0},
citedby = {0},
pages = {406-412},
booktitle = {2010 IEEE/WIC/ACM International Conference on Web Intelligence, WI 2010, Toronto, Canada, August 31 - September 3, 2010, Main Conference Proceedings},
editor = {Jimmy Xiangji Huang and Irwin King and Vijay V. Raghavan and Stefan Rueger},
publisher = {IEEE},
isbn = {978-0-7695-4191-4},
}