Eduardo H. Ramírez, Ramón F. Brena, Davide Magatti, Fabio Stella. Probabilistic Metrics for Soft-Clustering and Topic Model Validation. In Jimmy Xiangji Huang, Irwin King, Vijay V. Raghavan, Stefan Rueger, editors, 2010 IEEE/WIC/ACM International Conference on Web Intelligence, WI 2010, Toronto, Canada, August 31 - September 3, 2010, Main Conference Proceedings. pages 406-412, IEEE, 2010. [doi]
Abstract is missing.