Jose L. Ramirez, Fabiano Fruett. Multi-Terminal PiezoMOSFET Sensor for Stress Measurements in Silicon. In 31st Symposium on Integrated Circuits and Systems Design, SBCCI 2018, Bento Gonçalves, RS, Brazil, August 27-31, 2018. pages 1-6, IEEE, 2018. [doi]
@inproceedings{RamirezF18-0, title = {Multi-Terminal PiezoMOSFET Sensor for Stress Measurements in Silicon}, author = {Jose L. Ramirez and Fabiano Fruett}, year = {2018}, doi = {10.1109/SBCCI.2018.8533243}, url = {https://doi.org/10.1109/SBCCI.2018.8533243}, researchr = {https://researchr.org/publication/RamirezF18-0}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {31st Symposium on Integrated Circuits and Systems Design, SBCCI 2018, Bento Gonçalves, RS, Brazil, August 27-31, 2018}, publisher = {IEEE}, isbn = {978-1-5386-7431-4}, }