David Ramírez, Jorge Iscar, Javier Vía, Ignacio Santamaría, Louis L. Scharf. The locally most powerful invariant test for detecting a rank-P Gaussian signal in white noise. In IEEE 7th Sensor Array and Multichannel Signal Processing Workshop, SAM 2012, Hoboken, NJ, USA, June 17-20, 2012. pages 493-496, IEEE, 2012. [doi]
Abstract is missing.