P. J. Ramón-Torregrosa, M. A. Rodríguez-Valverde, M. A. Cabrerizo-Vílchez. New Trends in Rough Surface Characterization: When the Wrinkle is Beautiful. In 2005 International Conference on MEMS, NANO, and Smart Systems (ICMENS 2005), 24-27 July 2005, Banff, Alberta, Canada. pages 47-48, IEEE Computer Society, 2005. [doi]
Abstract is missing.