Elias de Almeida Ramos, Ricardo Reis 0001. Using Lyapunov Exponents to Estimate Sensitivity to Process Variability. In 14th IEEE Latin America Symposium on Circuits and System, LASCAS 2023, Quito, Ecuador, February 28 - March 3, 2023. pages 1-4, IEEE, 2023. [doi]
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