On-Chip Stimulus Generator for Gain, Linearity, and Blocking Profile Test of Wideband RF Front Ends

Rashad Ramzan, N. Ahsan, Jerzy Dabrowski. On-Chip Stimulus Generator for Gain, Linearity, and Blocking Profile Test of Wideband RF Front Ends. IEEE T. Instrumentation and Measurement, 59(11):2870-2876, 2010. [doi]

Abstract

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