High performance control of atomic force microscope for high-speed image scanning

M. S. Rana, Hemanshu Roy Pota, Ian R. Petersen. High performance control of atomic force microscope for high-speed image scanning. In 12th International Conference on Control Automation Robotics & Vision, ICARCV 2012, Guangzhou, China, December 5-7, 2012. pages 1187-1192, IEEE, 2012. [doi]

Abstract

Abstract is missing.