Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
James Randa, David K. Walker. On-Wafer Measurement of Transistor Noise Parameters at NIST. IEEE T. Instrumentation and Measurement, 56(2):551-554, 2007. [doi]
Abstract is missing.