Venkatesh Prasad Ranganath, Pradip Vallathol, Pankaj Gupta. Compatibility testing using patterns-based trace comparison. In Ivica Crnkovic, Marsha Chechik, Paul Grünbacher, editors, ACM/IEEE International Conference on Automated Software Engineering, ASE '14, Vasteras, Sweden - September 15 - 19, 2014. pages 469-478, ACM, 2014. [doi]
Abstract is missing.