Sidharth Rao, Woojin Kim, Simon Van Beek, Shreya Kundu, Manu Perumkunnil, Stefan Cosemans, Farrukh Yasin, Sebastien Couet, Robert Carpenter, Barry J. O'Sullivan, Shamin H. Sharifi, N. Jossart, Laurent Souriau, Ludovic Goux, Dimitri Crotti, Gouri Sankar Kar. STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application. In IEEE International Memory Workshop, IMW 2021, Dresden, Germany, May 16-19, 2021. pages 1-4, IEEE, 2021. [doi]
@inproceedings{RaoKBKPCYCCOSJS21,
title = {STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application},
author = {Sidharth Rao and Woojin Kim and Simon Van Beek and Shreya Kundu and Manu Perumkunnil and Stefan Cosemans and Farrukh Yasin and Sebastien Couet and Robert Carpenter and Barry J. O'Sullivan and Shamin H. Sharifi and N. Jossart and Laurent Souriau and Ludovic Goux and Dimitri Crotti and Gouri Sankar Kar},
year = {2021},
doi = {10.1109/IMW51353.2021.9439592},
url = {https://doi.org/10.1109/IMW51353.2021.9439592},
researchr = {https://researchr.org/publication/RaoKBKPCYCCOSJS21},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Memory Workshop, IMW 2021, Dresden, Germany, May 16-19, 2021},
publisher = {IEEE},
isbn = {978-1-7281-8517-0},
}