Localization under random measurements with application to radiation sources - researchr publication authors

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Nageswara S. V. Rao, Mallikarjun Shankar, Jren-Chit Chin, David K. Y. Yau, Chris Y. T. Ma, Yong Yang, Jennifer C. Hou, Xiaochun Xu, Sartaj Sahni. Localization under random measurements with application to radiation sources. In 11th International Conference on Information Fusion, FUSION 2008, Cologne, Germany, June 30 - July 3, 2008. pages 1-8, IEEE, 2008. [doi]

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