Nageswara S. V. Rao, Mallikarjun Shankar, Jren-Chit Chin, David K. Y. Yau, Chris Y. T. Ma, Yong Yang, Jennifer C. Hou, Xiaochun Xu, Sartaj Sahni. Localization under random measurements with application to radiation sources. In 11th International Conference on Information Fusion, FUSION 2008, Cologne, Germany, June 30 - July 3, 2008. pages 1-8, IEEE, 2008. [doi]
@inproceedings{RaoSCYMYHXS08,
title = {Localization under random measurements with application to radiation sources},
author = {Nageswara S. V. Rao and Mallikarjun Shankar and Jren-Chit Chin and David K. Y. Yau and Chris Y. T. Ma and Yong Yang and Jennifer C. Hou and Xiaochun Xu and Sartaj Sahni},
year = {2008},
url = {http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4632200},
researchr = {https://researchr.org/publication/RaoSCYMYHXS08},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {11th International Conference on Information Fusion, FUSION 2008, Cologne, Germany, June 30 - July 3, 2008},
publisher = {IEEE},
isbn = {978-3-00-024833-2},
}